Library of Congress Cataloging-in-Publication Data: Schroder, Dieter K. Semiconductor material and device characterization / by Dieter K. Schroder. p. cm. 10 Feb Dieter K. Schroder Semiconductor Material and Device Characterizationremains the sole text dedicated to characterization techniques. Semiconductor material and device characterization. Front Cover. Dieter K. Schroder. Wiley, – Technology & Engineering – pages.

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Schroder Snippet view – Semiconductor material and device characterization Dieter K. Semiconductor material and device characterization Dieter K. Semiconductor material and device characterization Dieter K. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

This newly revamped and expanded Second Edition incorporates the many innovations that have come to dominate the field during the past decade.

Chapter 3 Contact Resistance and Schottky Barriers. Carrier and Doping Density.

Chapter 11 Chemical and Physical Characterization. Semiconductor Material and Device Characterization. Reliability and Failure Analysis.

Schroder Limited semiconductkr – Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding: Charge-Based and Probe Characterization introduces charge-basedmeasurement and Kelvin probes.

Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. No eBook available Wiley.

This Third Edition updates a landmark text with semiconductoe findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization bringsthe text fully up-to-date with the latest developments in the fieldand includes new pedagogical tools to assist readers.

My library Help Advanced Book Search. Chapter 2 Carrier and Doping Density.

Semiconductor Material and Device Characterization, 3rd Edition

User Review – Flag as inappropriate funcion semcionductor pp’2. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Editionincluding:. This practical new edition is ideal for textbook adoptions at the graduate level and is destined to become an essential reference for research and development teams in the semiconductor industry.

Contents Chapter 1 Resistivity. High Temperature Electronics F.

Semiconductor Material and Device Characterization – Dieter K. Schroder – Google Books

Written semiconductor material and device characterization by dieter k.schroder an internationally dieer authority in the field, Semiconductor Material and Device Characterization remainsessential reading for graduate students as well as forprofessionals working in the field of semiconductor devices andmaterials. Updated and revised figures and examples reflecting the most current data and information. Would you like b change to the site?

Institute semiconductor material and device characterization by dieter k.schroder Electrical and Electronics Engineers. It covers the full range of electrical and optical characterization methods while From scanning probe techniques to the detection of metallic impurities in silicon wafers to cbaracterization use of microwave reflection to measure contactless resistivity, each chapter presents state-of-the-art tools and techniques, most of which were in their infancy or had not yet been developed when the previous zemiconductor first came out.

Chapter 9 Chargebased and Probe Characterization. Plus, two new chapters have been added: Updated and revised figures and examples reflecting the mostcurrent data and information new references offering access to the latest research anddiscussions in specialized topics New problems and review questions at the end of each chapter totest readers’ understanding of the material In addition, readers will find fully updated and revisedsections in each chapter.

Semiconductor material and device characterization – Dieter K. Schroder – Google Books

You are currently using the site but have requested a page in the site. Amd 1 List of Symbols. Not only doesthe Third Edition set forth all the latest measurementtechniques, but it also examines new interpretations and newapplications of existing techniques. The Third Edition of the internationally lauded Charracterization Material and Device Characterization brings the text fully up-to-date with characterizatikn latest developments in the field and includes new pedagogical tools to assist readers.

Selected pages Title Page. Updated and revised figures and examples reflecting the mostcurrent data and information new references offering access to the latest research semiconductor material and device characterization by dieter k.schroder in specialized topics New problems and review questions at the end of each chapter totest readers’ understanding of the material In addition, readers will find fully updated and revisedsections in each chapter.

Schroder Snippet view – No eBook available Wiley. Reliability and Failure Analysis examines failure times anddistribution functions, and discusses electromigration, hotcarriers, gate oxide integrity, negative bias temperatureinstability, stress-induced leakage current, and electrostaticdischarge.

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Coverage includesthe full range of electrical and optical characterization methods,including the more specialized chemical and physical techniques. This chapter also examinesprobe-based measurements, including scanning capacitance, scanningKelvin force, scanning spreading resistance, and ballistic electronemission microscopy.

My library Help Advanced Book Search. This Third Edition updates a landmark text with thelatest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization bringsthe text fully up-to-date with the latest developments in the fieldand includes new pedagogical tools to assist readers.